Panjab University, Chandigarh has announced the PU CET 2022 exam dates today, May 17, 2022. The complete date sheet for the examination has been released on the official website, exams.puchd.ac.in. The university has already completed the application form filling for PU CET 2022. Candidates willing to take admission in any of the UG courses offered by the university can keep a tab on the website for further updates.
PU CET 2022 Exam Date
The university has released a notice notifying about the dates of the different entrance exams conducted for admission to session 2022-23. As per that, this year, PU CET 2022 exam shall be held on June 26, 2022. The university has not mentioned any timings or any other updates regarding the examination.
The university has not notified any more details related to the PU CET (UG) examination, like admit card release date. Therefore, the candidates are advised to keep a tab on the official website for any further updates related to the examination on the official website.
As per the website, the PU CET UG exam is going to be held for a total of 12 disciplines. The exam centres for taking up this exam are predecided by the university and shall be held at Chandigarh, Ludhiana, Hoshiarpur, and Muktsar. The candidates shall be assigned any of the exam centers mentioned here on the basis of availability in the test centers.
PU CET (UG) Exam Pattern 2022
PU CET examination is going to be held in the offline mode i.e. pen and paper. The examination is going to have 240 questions in Mathematics, Biology, Chemistry and Physics. Each subject is going to account for 60 questions and each section will be assigned 70 minutes to complete the paper. For each section, candidates shall be awarded 2 marks and a negative marking of 0.25 marks is applicable for wrong answers.
The candidates who successfully clear the examination shall be called for the counselling round. In this round, a panel shall check their documents and provide them admission on the basis of course preference and seat availability.
